Hi All,
I was trying to perform the Sampler Leak Test on the G7167B 1290 Multisampler. Whenever it reaches the last portion of the leak test (Blindseat leak measurement) the pressure just could not build up and the whole Sampler leak test will fail…
Two instruments are running off the one computer (two cards). One is a 6890N/5973N, one is 6890N/5975 with Gerstel Rail. Neither instrument has an FID, just the one MS detector, so only one signal from each. It doesn't seem to matter if both instruments…
Let me summarize...
Everything that you 've shared with us ALAZ looks perfectly normal, except the calibration on one of the FID channels doesn't show all of the calibration levels.
I'm now completely out of ideas. You've done everything that I would…
Hello MarKon ,
Those the only options I would be familiar with and I can recommend.
The calibration indeed seems to only address the sample transfer from tray to turret, and I don't imagine it has anything to do with the Gripper. Since you are…
Hello,
Please try replacing the torch. If that does not resolve your issue, please contact Agilent customer support to begin the process of opening a repair service order. It is possible that your waveguide has failed. Have a great day
Hi Marty,
After transferring the CC file, I linked it to my processing method and reprocessed all data. There are no errors after processing. By broken, I mean that the values are not showing up/blank in my injection results (and also in my custom report…
Running a 7800 ICP-MS and during the past two weeks have been experiencing difficulties. The doubly charge percentage has continually risen with each day of testing. I have removed and cleaned the cones and lens stack and conditioned before use. I checked…
Hello,
Having sorted out our printer problem with MassHunter for GC we started having another issue on Friday night last week. The software suddenly stopped mid run giving an error that the drivers for the MSD could not be found. After restarting…
Hi. The pump made loud noises for several days. After that, the pump stopped working normally. Near 600 rpm the pump stops and A-PLUS Software was showing fail status (205) with error code 206 (bit 128) - too hight load. We use Agilent pump - TPS compact…
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue:
The Flame Ionization Detector (FID) jet could become clogged with ferrule material, column bleed, or heavy molecular analytes. The clogged jet will affect...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different high concentration, split analysis techniques including:
General use liners
Auto inject, general use
Auto...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different splitless trace analysis techniques including:
General use liners
Pressure, temperature, volume (PTV)
Hot...
This Information Applies To: Agilent 6890, 7890, 7820, 8890 and 8860 GC Systems with Split/Splitless (S/SL) inlet
Issue
Replacement of the Gold Seal is required as part of inlet maintenance. Replacement is required when the performance of the inlet...
This Information Applies To: Agilent GC Systems with Micro-ECD.
Issue
The Wipe Test is an annual test that performed by end user of the micro-ECD (Micro Electron Capture Detector or uECD) to help ensure radioactive safety when using the detector...
This Information Applies To: Agilent GC Systems with thermal conductivity detector (TCD)
Issue
Baking the thermal conductivity detector (TCD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items...
This Information Applies To: Agilent GC Systems with flame ionization detector (FID)
Issue
Baking out the flame ionization detector at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items required...
This Information Applies To: Micro Electron Capture Detector (uECD)
Issue
Baking the micro electron capture detector (µECD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Warning ...
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue
This article will describe how an operator can configure the makeup gas on both the instrument keypad and the software driver (Method Editor).
Background...
This Information Applies To: Agilent HPLC systems
Issue
The presence of ghost peaks can be a symptom of a system contamination issue, caused by accumulation of sample and/or foreign substances in the flow path. It is critical for high sensitivity...