In spectroscopy, the quality of spectral data depends greatly on the incident beam that passes through the sample being analyzed. For samples analyzed at large angles of incidence (AOI), such as bandpass and edge filters (e.g., beam splitters), maintaining…
In my case, the problem was due to an account that could not log in to the company-specific drive where all measurement results are saved. If you have the same problem, try another account and it should work.
I will list a few common errors with this. If it isn't one of the common errors, you may need to get tech support involved to fix it because the software may not be working properly.
Is solvent flowing properly? When you tell one line to be used at…
Dear, Sr
When I want to go to execute any program in WinUV software, it gives a message "Error code 9:1 CSM error,CSM error"
It seems a comunnication error, the instrument is connected via GPIB-USB-HS.
Anyone knows how to do?
I assume it is packed tight with insulation? Otherwise I'd just call Agilent for any ideas, maybe a board is bad or something and you need a service call.
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue:
The Flame Ionization Detector (FID) jet could become clogged with ferrule material, column bleed, or heavy molecular analytes. The clogged jet will affect...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different high concentration, split analysis techniques including:
General use liners
Auto inject, general use
Auto...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different splitless trace analysis techniques including:
General use liners
Pressure, temperature, volume (PTV)
Hot...
This Information Applies To: Agilent 6890, 7890, 7820, 8890 and 8860 GC Systems with Split/Splitless (S/SL) inlet
Issue
Replacement of the Gold Seal is required as part of inlet maintenance. Replacement is required when the performance of the inlet...
This Information Applies To: Agilent GC Systems with Micro-ECD.
Issue
The Wipe Test is an annual test that performed by end user of the micro-ECD (Micro Electron Capture Detector or uECD) to help ensure radioactive safety when using the detector...
This Information Applies To: Agilent GC Systems with thermal conductivity detector (TCD)
Issue
Baking the thermal conductivity detector (TCD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items...
This Information Applies To: Agilent GC Systems with flame ionization detector (FID)
Issue
Baking out the flame ionization detector at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items required...
This Information Applies To: Micro Electron Capture Detector (uECD)
Issue
Baking the micro electron capture detector (µECD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Warning ...
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue
This article will describe how an operator can configure the makeup gas on both the instrument keypad and the software driver (Method Editor).
Background...
This Information Applies To: Agilent HPLC systems
Issue
The presence of ghost peaks can be a symptom of a system contamination issue, caused by accumulation of sample and/or foreign substances in the flow path. It is critical for high sensitivity...