One of the most challenging tasks for vacuum system designers is to create ultra-high and extreme-high vacuum pressures. Pumps capable of generating UHV and XHV pressure include Sputter Ion Pumps, Titanium Sublimation Pumps and Non-Evaporative Getters…
A system with poorly designed conductance can have drastic consequences on the effective pumping speed: the cornerstone of this tutorial is to emphasize the need to design a system that does not have negative effects on the performance of a high or ultrahigh…
Thermal gauges, out of all the available gauge technologies, offer excellent value for measuring rough vacuum pressure, but even UHV and XHV systems can benefit from them. All thermal gauges operate by heating a filament and exposing it to the vacuum…
When detecting leaks, it is important to distinguish between virtual and real ones. Examples of virtual leaks can be: gas desorption, diffusion, trapped volume, and back streaming. Leak-up or rate-of-rise tests can indicate whether a vacuum system's base…
Ionization gauges convert residual molecules to positively charged ions, and then attract them to a negatively charged collector where they create a measurable current. Modifications to high vacuum ionization gauges can optimize their performance at a…
No one gauge technology will provide pressure measurement throughout the range of vacuum. Combining vacuum sensors can produce a gauge capable of measuring pressure better than with any single technology. After having highlighted the properties of individual…
When choosing a vacuum gauge, it is possible to adopt high vacuum ionization gauges or sputter ion current. After describing the basic operating principle of the Sputter ion pump, this video shows how to measure UHV pressure with Agilent SIPs.
Material preparation and cleaning in ion pump manufacturing is critical to achieving ultrahigh vacuum pressures. One cleaning process to which the pump components are subjected is vacuum firing, through which the outgassing rate of the pump is reduced…
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Customer feedback on turbo pumps often highlights concerns regarding the durability of these high-speed vacuum devices. However, users can take concrete steps to significantly enhance uptime…
This Information Applies To: Agilent ICP-MS systems (7700/7800/7850/7900/8800/8900)
Issue
How to power on the Agilent ICP-MS Foreline Pump when fully powering on the Agilent ICP-MS System, or after performing maintenance.
Background
The ICP...
This Information Applies To: Agilent ICP-MS MassHunter Software version 5.1 and above
Issue
The user manuals for Agilent ICP-MS Systems for MassHunter 5.1 and above are included in the ICP-MS MassHunter Help and Learning Center. There are manuals...
This Information Applies To: Agilent ICP-MS systems (7700/7800/7850/7900/8800/8900)
Issue
Elevated oxide ratio values are defined as greater than 1.5% for x-lens configuration or greater than 3% for s-lens configuration. Possible causes are contamination...
This Information Applies To: Agilent GC/MS Systems
Issue
The software version is a valuable information usually required for troubleshooting, software updates preparation or to check installed options.
Table of contents
MassHunter GC/MS Acquisition...
This Information Applies To: Agilent LC modules with RFID tag readers
Issue
Agilent uses RFID (radio frequency identification tag) tag readers in some HPLC components such as detector lamps and flow cells, pump heads, purge valve and mixers. However...
This Information Applies To: Agilent LC systems with Lab Advisor software.
Issue
In Lab Advisor, the Logs and Results register is available for gathering history and additional information on the system. It presents data collected from the configured...
This Information Applies To: Agilent ICP-MS systems (7700/7800/7850/7900/8800/8900)
Issue
What information does the ICP-MS instrument status indicator provide?
Background
The ICP-MS Instrument Status Indicator on the instrument, and in the...
This Information Applies To: Agilent ICP-MS systems (7700/7800/7850/7900/8800/8900)
Issue
How to power off Agilent ICP-MS systems before maintenance, for long-term shutdown, or for power cycling the instrument. Power cycling may be required when...
This Information Applies To: Agilent OpenLab CDS
Issue
Steps to close an instrument connection to a primary instrument controller, to start a successful connection to a secondary instrument controller, or to configure the instrument.
Background...
This Information Applies To: Agilent HES source, Agilent 5977 Series GC/MSD
Issue:
During normal operation of the GC/MSD, the ion source will need to be disassembled to proceed with abrasive ion source cleaning and / or replacement of consumable...