Hello Agilent Community Our Zero Air / Nitrogen generator from Parker Balston broke down and it has been discontinued. The supplier does not offer replacement parts and they do not longer have a gas generator model with the combination Air/Nitrogen. Therefore…
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I've got a SEQ type CC that should be calculated only once during the reprocessing and a peak or group type that uses the result of the SEQ one. Since this the SEQ type CC is calculated inj number * peak number times.... is it possible to avoid…
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I'm hoping to seek some help for a problem I've been experiencing. We currently run a GC-FID with a headspace sampler testing for Acetic Acid, Propionic Acid, and Butyric Acid. I've been having issues reading the acetic acid consistently. Any…
Larger are the orifices of the cones, particularly the sample cone, more chance you have to get the IF/Bk pressure errors. Usually when the sample cone is too used then is passing too much air or whatever trough it at the interface, and the ICP senses…
Hi everyone!
I have brand new PGC Yokogawa 8000 equipped CP-Chirasil-Dex CB Columns with FID detector and Liquid Sample Valve (LSV) set at 170C deg. The problem is GC can’t separate m-Xylene from p-Xylene in low concentrations.
Component name…
I'm a new GC/MS user and I have the following error: Inlet: Pressure Pre Shutdown warning after changing the column of a Intuvo 9000 Device. The total flow target of 4mL +/-2mL/min fails and the leak rate doesnt' reach values below 11mL/min. Can anyone…
Hi Crystalnipp (great username!!) Thanks for the clear answer I do have a question for you. We also run N2 make-up to our FID. As of now we run He and our night standby method is to leave the GC oven at 150°C with 0.5mL/mim He flow. We turn flame and…
Hi acraig First replace saptum until if you don't detected leak because sometime tiny leak in saptum cause low sensitivity. Second sometimes over tightening the ferrule connection of column to injector cause constriction the flow and reduce analyte at…
Hello,
I have inherited a 5975 MSD and when I go to autotune, there are no peaks present and the tune fails. I get alternating errors "Gain and Offset = 0 and peaks are too narrow" or "Tune action stopped: The valid Range for Ent Lens Offset is 0…
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue:
The Flame Ionization Detector (FID) jet could become clogged with ferrule material, column bleed, or heavy molecular analytes. The clogged jet will affect...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different high concentration, split analysis techniques including:
General use liners
Auto inject, general use
Auto...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different splitless trace analysis techniques including:
General use liners
Pressure, temperature, volume (PTV)
Hot...
This Information Applies To: Agilent 6890, 7890, 7820, 8890 and 8860 GC Systems with Split/Splitless (S/SL) inlet
Issue
Replacement of the Gold Seal is required as part of inlet maintenance. Replacement is required when the performance of the inlet...
This Information Applies To: Agilent GC Systems with Micro-ECD.
Issue
The Wipe Test is an annual test that performed by end user of the micro-ECD (Micro Electron Capture Detector or uECD) to help ensure radioactive safety when using the detector...
This Information Applies To: Agilent GC Systems with thermal conductivity detector (TCD)
Issue
Baking the thermal conductivity detector (TCD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items...
This Information Applies To: Agilent GC Systems with flame ionization detector (FID)
Issue
Baking out the flame ionization detector at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items required...
This Information Applies To: Micro Electron Capture Detector (uECD)
Issue
Baking the micro electron capture detector (µECD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Warning ...
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue
This article will describe how an operator can configure the makeup gas on both the instrument keypad and the software driver (Method Editor).
Background...
This Information Applies To: Agilent HPLC systems
Issue
The presence of ghost peaks can be a symptom of a system contamination issue, caused by accumulation of sample and/or foreign substances in the flow path. It is critical for high sensitivity...