One of the most challenging tasks for vacuum system designers is to create ultra-high and extreme-high vacuum pressures. Pumps capable of generating UHV and XHV pressure include Sputter Ion Pumps, Titanium Sublimation Pumps and Non-Evaporative Getters…
A system with poorly designed conductance can have drastic consequences on the effective pumping speed: the cornerstone of this tutorial is to emphasize the need to design a system that does not have negative effects on the performance of a high or ultrahigh…
Thermal gauges, out of all the available gauge technologies, offer excellent value for measuring rough vacuum pressure, but even UHV and XHV systems can benefit from them. All thermal gauges operate by heating a filament and exposing it to the vacuum…
When detecting leaks, it is important to distinguish between virtual and real ones. Examples of virtual leaks can be: gas desorption, diffusion, trapped volume, and back streaming. Leak-up or rate-of-rise tests can indicate whether a vacuum system's base…
Ionization gauges convert residual molecules to positively charged ions, and then attract them to a negatively charged collector where they create a measurable current. Modifications to high vacuum ionization gauges can optimize their performance at a…
No one gauge technology will provide pressure measurement throughout the range of vacuum. Combining vacuum sensors can produce a gauge capable of measuring pressure better than with any single technology. After having highlighted the properties of individual…
When choosing a vacuum gauge, it is possible to adopt high vacuum ionization gauges or sputter ion current. After describing the basic operating principle of the Sputter ion pump, this video shows how to measure UHV pressure with Agilent SIPs.
Material preparation and cleaning in ion pump manufacturing is critical to achieving ultrahigh vacuum pressures. One cleaning process to which the pump components are subjected is vacuum firing, through which the outgassing rate of the pump is reduced…
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue:
The Flame Ionization Detector (FID) jet could become clogged with ferrule material, column bleed, or heavy molecular analytes. The clogged jet will affect...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different high concentration, split analysis techniques including:
General use liners
Auto inject, general use
Auto...
This Information Applies To: Agilent GC Systems with Split/Splitless (S/SL) inlet
Issue
Different liners are required for different splitless trace analysis techniques including:
General use liners
Pressure, temperature, volume (PTV)
Hot...
This Information Applies To: Agilent 6890, 7890, 7820, 8890 and 8860 GC Systems with Split/Splitless (S/SL) inlet
Issue
Replacement of the Gold Seal is required as part of inlet maintenance. Replacement is required when the performance of the inlet...
This Information Applies To: Agilent GC Systems with Micro-ECD.
Issue
The Wipe Test is an annual test that performed by end user of the micro-ECD (Micro Electron Capture Detector or uECD) to help ensure radioactive safety when using the detector...
This Information Applies To: Agilent GC Systems with thermal conductivity detector (TCD)
Issue
Baking the thermal conductivity detector (TCD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items...
This Information Applies To: Agilent GC Systems with flame ionization detector (FID)
Issue
Baking out the flame ionization detector at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items required...
This Information Applies To: Micro Electron Capture Detector (uECD)
Issue
Baking the micro electron capture detector (µECD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Warning ...
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue
This article will describe how an operator can configure the makeup gas on both the instrument keypad and the software driver (Method Editor).
Background...
This Information Applies To: Agilent HPLC systems
Issue
The presence of ghost peaks can be a symptom of a system contamination issue, caused by accumulation of sample and/or foreign substances in the flow path. It is critical for high sensitivity...