This Information Applies To: Agilent GC Systems with Micro-ECD.
Issue
The Wipe Test is an annual test that performed by end user of the micro-ECD (Micro Electron Capture Detector or uECD) to help ensure radioactive safety when using the detector...
This Information Applies To: Agilent GC Systems with thermal conductivity detector (TCD)
Issue
Baking the thermal conductivity detector (TCD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items...
This Information Applies To: Agilent GC Systems with flame ionization detector (FID)
Issue
Baking out the flame ionization detector at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Items required...
This Information Applies To: Micro Electron Capture Detector (uECD)
Issue
Baking the micro electron capture detector (µECD) at high temperatures can remove sample contaminants that have deposited on the detector surfaces.
Warning ...
This Information Applies To: Agilent GC Systems with Flame Ionization Detector (FID)
Issue
This article will describe how an operator can configure the makeup gas on both the instrument keypad and the software driver (Method Editor).
Background...