I'm working with an Agilent 6890 with dual columns and micro-ECD detectors. The rear detector temperature is affected when the oven temperature is increasing or decreasing, and takes a very long time to stabilize at the correct temperature. It even fluctuates while the instrument is running and it seems to impact results, as the front signal still looks normal.
The analyte retention times (for both signals) also shift slightly with every few samples, and I've done everything recommended to resolve this from the inlet to the detectors. I'm not sure if these two issues can be related.
Just wondering if there is anything I can do before logging a service call, thank you!
