Agilent 7890A GC dual-channel FID, Agilent 7890B GC, and Agilent 5977A Series GC/MSD System carrier lines fitted with three-way valves attached to a pure helium line and a 1,000 µL/L oxygen-doped helium cylinder were used to simulate systems with air leaks. Column bleed, retention time drift, endrin/DDT breakdown, background noise, and electron multiplier voltages were monitored with and without oxygen in the carrier gas. Detrimental effects of oxygen in the carrier gas were observed almost immediately and persisted on both systems. Electron multiplier voltage climbed to 2,350 volts and the filament ruptured after 15 days of cumulative exposure to oxygen doped in the helium carrier.
Publication number: 5991-4110EN.pdf
Publication Date: February 27, 2014